Abstract
On the basis of the Monte Carlo algorithm, a method for calculating the energy spectrum of hot nonequilibrium electrons and holes in the track of a primary recoil atom after being exposed to single fast neutrons is developed. The heating and subsequent relaxation of nonequilibrium charge carriers in silicon in the track of a charged particle with initial energies in the range of 50–200 keV are calculated. The characteristic temperatures of the electron and hole plasma are obtained, which amount to 5400 and 2700 K, respectively. The effect of the radiation-induced heating of charge carriers on the failure stability of static memory cells is discussed.
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