Abstract
In this work the concept, circuits and algorithms for an efficient off-line Built-In Self-Test (BIST) in watt hour meters are presented. On-chip signal generator is needed and additional digital hardware is necessary to evaluate the result. For a good signal to noise ratio (SNR) as well as good frequency resolution, a large number of samples would be needed to accurately calculate the FFT of the result. This approach is time-consuming and inappropriate for BIST, since it requires too much silicon area. We tried to avoid FFT calculation and replace it with small digital hardware and hardware algorithm running on the chip. The most important errors, which may happen in measurement path during the operation of the watt hour meter, can be efficiently detected. The parameters obtained by the suggested BIST hardware/algorithm were compared to the results obtained by the FFT for verification. The results confirm that the proposed concept of BIST could be used for an efficient on chip and off-line built-in self-test.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
