Abstract
For the first time, the current failure of p-channel MOSFETs used for the sub-wordline driver of state-of-the-art DRAM chips was investigated during off-state switching cycles. With increasing switching speed for the sub-wordline driver, the subthreshold leakage current of p-channel MOSFETs increased, and resulted in serious stand-by current failure. The model proposed in this work suggested that the off-state degradation of p-channel MOSFETs with ac bias will intensify as the dimensions of devices decrease due to both the high electric field and the high operating frequency. The roles of various device parameters- such as gate length, gate-tab width, doping concentration at the source/drain extensions, operating temperature and operating frequency- on the degradation of p-channel MOSFETs were investigated.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
