Abstract
We study plasmon-related excitations in InN by micro-Raman spectroscopy. The surface sensitivity of Raman scattering is found to be strongly enhanced for backscattering from cleaved edges of thick films. This fact enables us to observe the electron accumulation layer at the surface of InN and to deduce the associated volume charge density.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have