Abstract
Using the target current spectroscopy (TCS) technique, we have measured the angle-dependent electron absorption spectra of layered TiS 2 in the energy range 0–30 eV. Apart from major angle-dependent structures manifesting the bulk band structure, the spectra also featured narrow oscillations converging to the emergence thresholds of diffraction beams. We identified them as due to surface resonances. This effect opens possibilities for accurate determination of surface potential barriers of layered materials.
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