Abstract
We report on the observation of spontaneous Raman scattering in silicon photonic crystal waveguides. Continuous-wave measurements of both forward scattered and backscattered Stokes emissions are reported in single line-defect waveguides in hexagonal lattice photonic crystal silicon membranes. By utilizing the Bragg gap edge dispersion of the TM-like mode for pump enhancement and the TE-like fundamental mode onset for Stokes enhancement, the spontaneous Raman scattering coefficient was observed to increase by up to six times in the region of slow group velocity. The results show explicit nonlinear enhancement in a silicon photonic crystal slow-light waveguide device.
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