Abstract
Noncontact scanning nonlinear dielectric microscopy (NC-SNDM) has the ability to simultaneously acquire the surface topography and polarization distribution at the nanoscale through the measurement of local nonlinear dielectric constants of materials. NC-SNDM was here applied to the observation of Si(111) reconstructed surfaces. Images of the polarization distribution clearly distinguished disordered regions of the surface, often called 1×1 regions, at the boundaries between the regular (7×7) domains. We acquired polarization images of surfaces with different sizes of 1×1 regions and show that NC-SNDM has the potential to image trapped charges of surfaces and interfaces.
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