Abstract
We observed for the first time a two-dimensional growth mode in the c-axis barium ferrite (BaM) thin film grown on (0001) sapphire substrate by pulsed-laser deposition. Both the X-ray diffraction analysis (XRD) and the surface morphology showed that the film had excellent crystalline structure with flat terraces and straight growth steps. Well-coalesced grains formed smooth film surface and resulted in unclear grain boundaries. Compared with the BaM thin film grown on (111) Si and (001) LiTaO 3 substrates, we suggested that the BaM film obtained in this experiment had undergone a different growth mode. The magnetic data of the BaM thin film is also given.
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