Abstract
Deflection due to planar channeling and volume reflection in short bent silicon crystals was observed for the first time for 150 GeV/c negative particles, π− mesons, at one of the secondary beams of the CERN SPS. The deflection efficiency was about 30% for channeling and higher than 80% for volume reflection. Volume reflection occurs, in spite of the attractive character of the forces acting between the particles and the crystal planes, in a wide angular range of the crystal orientations determined by the crystal bend angle.
Highlights
Deflection due to planar channeling and volume reflection in short bent silicon crystals was observed for the first time for 150 GeV/c negative particles, π − mesons, at one of the secondary beams of the CERN
In spite of the attractive character of the forces acting between the particles and the crystal planes, in a wide angular range of the crystal orientations determined by the crystal bend angle
When the particle transverse energy is smaller than the depth of the planar potential well it moves along the trajectory oscillating around the crystal plane
Summary
Deflection due to planar channeling and volume reflection in short bent silicon crystals was observed for the first time for 150 GeV/c negative particles, π − mesons, at one of the secondary beams of the CERN. Observation of channeling and volume reflection in bent crystals for high-energy negative particles
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