Abstract
Summary Numerical simulation based on the one dimensional (1D) Fukuyama, Lee and Rice (FLR) elastic model of randomly pinned charge density wave (CDW) systems are reported. In the weak pinning limit the threshold field E T obey a c i 2 behavior where c i is the impurity concentration. In a wide field and impurity concentration range, the current density J CDW and the excess conductivity σ CDW obey respectively J CDW ~(E/E T −1) a and σ CDW ~ (E T /E)(E/E T −) a in agreement with several previous experimental work; α is an impurites dependant exponent and E is the applied electric field.
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