Abstract

The electro-optic (EO) effect is a powerful diagnostic tool for determining the time profile of ultrashort relativistic electron bunches. When a relativistic bunch passes within a few mm of an electro-optic crystal, its transient electric field is equivalent to a half-cycle THz pulse passing through the crystal. The induced birefringence can be detected with polarized femtosecond laser pulses. A simulation code has been written in order to understand the faithfulness and the limitations of electron bunch shape reconstruction by EO sampling. The THz pulse and the laser pulse are propagated as wave packets through the EO crystal. Alternatively, the response function method is applied. Using experimental data on the material properties of zinc telluride (ZnTe) and gallium phosphide (GaP), the effects of velocity mismatch, pulse shape distortion, and signal broadening are explicitly taken into account. The simulations show that the most severe limitation on the time resolution is given by the transverse-optical (TO) lattice oscillation in the EO crystal. The lowest TO frequency is 5.3 THz in ZnTe and 11 THz in GaP. Only the Fourier components below the TO resonance are usable for the bunch shape reconstruction. This implies that the shortest rms bunch length which can be resolved with moderate distortion amounts to $\ensuremath{\sigma}\ensuremath{\approx}90\text{ }\text{ }\mathrm{fs}$ in ZnTe and $\ensuremath{\sigma}\ensuremath{\approx}50\text{ }\text{ }\mathrm{fs}$ in GaP. The influence of the crystal thickness on the amplitude and width of the EO signal is studied. The optimum thickness is in the range from 100 to $300\text{ }\text{ }\ensuremath{\mu}\mathrm{m}$ for ZnTe and from 50 to $100\text{ }\text{ }\ensuremath{\mu}\mathrm{m}$ for GaP.

Highlights

  • The electro-optic (EO) method has been successfully applied at several accelerators to study the time structure of ultrashort electron bunches [1,2,3]

  • Under the justified assumptions that the time duration of the laser pulse is significantly shorter than the temporal features of the effective THz pulse and the laser bandwidth ! is much less than the carrier frequency !0, it can be shown [25] that a simplified treatment is possible in which the laser pulse moves through the EO crystal with the optical group velocity vg

  • Using the available experimental data on the material properties of gallium phosphide (GaP) and zinc telluride (ZnTe), we have studied the effects of pulse broadening, pulse shape distortion, and phase and group velocity mismatch in the electro-optic detection of femtosecond electron bunches

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Summary

INTRODUCTION

The electro-optic (EO) method has been successfully applied at several accelerators to study the time structure of ultrashort electron bunches [1,2,3]. Precise measurements of the temporal profile of the compressed electron bunches are essential for the optimization of the accelerator and a proper understanding of the bunch compression mechanism including subtle effects such as coherent synchrotron radiation and space charge forces For this purpose an electro-optic detection system [4] has been installed at FLASH with an EO crystal placed inside the electron-beam vacuum. In practical accelerators time jitter is significant, and one has to resort to single-shot techniques such as spectral, temporal, or spatial decoding [1,2,3,4] if one wants to resolve ultrashort electron bunches These more advanced EO techniques can at best achieve the time resolution of a jitter-free EOS experiment and will not be discussed here.

ELECTRO-OPTIC EFFECTS IN ANISOTROPIC
D21 D22 D23
Electro-optic effect in zinc telluride and gallium phosphide
Determination of the main refractive indices
E EB sin with the field-dependent impermeability tensor
Principle of signal detection
Refractive index in the visible range
Refractive index in the THz range
Electro-optic coefficient
SIMULATION OF THE ELECTRO-OPTIC
Phase and group velocities
Pulse propagation
Response function
Computation of the phase retardation
Multiple reflections in the EO crystal
Consideration of laser-pulse broadening
QUALITY OF ELECTRO-OPTIC BUNCH SHAPE
Usable frequency range
Comparison of original bunch shape and computed
Dependence of the EO signal on the crystal thickness
Findings
SUMMARY

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