Abstract
The scanning permanent-magnet (PM) method was originally developed for determining the spatial distribution of the critical current density in a high-temperature superconducting (HTS) film. In the present study, its applicability to the crack detection in an HTS film is investigated numerically. To this end, a defect parameter is defined for characterizing a crack position and it is calculated along various scanning lines. The results of computations show that, only when the scanning position is near a crack, the defect parameter shows a violent change. On the basis of the behavior of the defect parameter, the method for roughly identifying a crack is also proposed.
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