Abstract

The reflow soldering process of large size components was always problematic in microelectronics manufacturing due to the possibility of component displacement failures after soldering; like tombstone formation or skewing, which can be traced back to the different heating of the opposite component sides. During vapour phase soldering, the efficiency of heat transfer highly depends on the thickness of the condensate layer. In this paper, the inhomogeneity of condensate layer formation and its effects were investigated at large size components during vapour phase soldering by numerical simulations. For this purpose, a 3D computational fluid dynamic model was established. According to the condensate layer formation in different cases, the onset differences in the melting of the solder alloy at the opposite leads of the component were calculated. By the results, the risk of the component displacement during reflow soldering was analysed. It was found, that the congestion of the condensate layer around the large size components can cause considerable differences in the onset of the solder alloy melting, which can yield in component displacement failures after soldering. The extent of difference in the onset of melting depends on the location of the component on the board and on the applied soak temperature. Keep-out zones on the board were suggested to reduce the possibility of the component displacement failures during the vapour phase soldering process.

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