Numerical analysis of an ultralow switching loss IGBT with super junction and blocking junction

Abstract

In order to reduce the switching loss (ESW) and enhance the breakdown voltage (BV), in this paper, an insulated gate bipolar transistor with an internal blocking junction and super junction (SJBJ-IGBT) is proposed and investigated. By inserting P-pillar and N-pillar on both sides of the drift region, a drift area with auxiliary depletion function can be formed. The junction of the primary blocking layer (JPB) is located internally in the device’s drift region. The JPB is reverse biased and withstand the main E-field during device turn-off. Meanwhile, the JPB is surrounded by P-pillar and N-pillar, reducing the E-field(E-field) peak value of device, and making E-field distribution more uniform. Furthermore, during device turn-on, the reduction of the effective area of drift region makes it easier for the JPB side of the P-drift region to accumulate excess holes. So that the SJBJ-IGBT is easier to turn-on. The snapback phenomenon of SJBJ-IGBT is eliminated. Simulation results demonstrate that, under the same forward conduction voltage (VON) condition, the proposed device exhibits a significantly lower turn-on energy loss (EON) compared to the traditional super junction(SJ-IGBT), and is 44.5% lower than that of IPBJ-IGBT, while their turn-off energy losses (EOFF) are almost equivalent.Besides, the optimized E-field distribution in the SJBJ-IGBT shows 13.2% improvement of BV. Researching results can provide important reference for reducing the ESW of IGBT.