Abstract

ABSTRACT The spark counter and the electrochemical etching greatly facilitate the counting of damage tracks in insulators. The normal electrochemical etching presents various shortcomings, which can be eliminated by a newly discovered electrochemical etching. The damage track detectors are only capable of storing the information. By contrast, the thin film breakdown counters provide real-time detection. The trait common to all the registration techniques described in this paper is the use of avalanche-type of processes (typically non-shorting electrical breakdown) to simplify the track counting and visualization.

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