Abstract
A curve tracer reveals a low-level current ‘spike’ in the gate-source characteristic of enhancement-mode MOSFETs. The origin of this spike is explained, and its use in measuring the threshold voltage of any MOSFET at a vanishingly small channel current is described. The technique also identifies whether the MOSFET is n-channel or p-channel, enhancement-mode or depletion-mode.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
