Novel preparation of nitrogen-doped titanium dioxide films

Abstract

In this work, nitrogen-doped titanium dioxide films with 0.001 mm thickness and 100 mm width have been prepared by stable cone-jet mode electrohydrodynamic atomization. The change in ammonium content in the sol varied the electrical conductivity and was used to obtain different nitrogen-doped titanium dioxide films. Raman spectroscopy, x-ray diffraction, Fourier transform infrared spectroscopy, x-ray photoelectron spectroscopy, field emission scanning electron microscopy, atomic force microscopy and UV/Vis spectroscopy were used to characterize as-deposited and annealed films. Raman spectra show the annealed films contained the anatase phase of TiO2 even at the higher concentration of nitrogen doping. UV/Vis spectra displayed a greater dip in transmittance in the visible light range consistent with the colour change of the films to yellow. The inclusion of nitrogen in the films expands the width of the localized states.