Abstract
The spatial distribution of signals in X-ray diffraction (XRD) may be very narrow, posing challenges in obtaining high angular resolution results through traditional methods. This article explores multi-frame super-resolution algorithms from the field of image processing, selecting and refining the best suited to the requirements of the crystal truncation rod (CTR) test. Consequently, a new algorithm with a corresponding methodology is proposed. This approach is subsequently applied to characterize the CTR signal of SrTiO3 single-crystal samples, effectively enhancing the clarity of blurry and rough CTR cross-section signals. The resolution with this method surpasses that obtained using the pixel size alone, which is beneficial for characterizing weak signals. By combining data in three dimensions, a significantly enhanced three-dimensional CTR signal is obtained. This method enables the extraction of otherwise difficult-to-obtain information and can be conveniently integrated into subsequent theoretical work. Moreover, these methods hold potential for application in other techniques that require improved resolution under similar conditions.
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