Abstract

In the past several years developments in epitaxial growth of GaN have made this material varible for device applications such as UV and blue-light-emitting diodes and short-wavelength lasers in optical memory. At the same time, metal organic vapor-phase epitaxial growth of GaN presents several technical challenges including high growth temperatures (in the range of 1100 °C), a small process parameter window, and strict requirements for highly uniform flow and temperature distribution over the area of deposition. Finite element analysis thermal modeling in combination with a novel experimental technique for real-time thermal mapping of the rotating wafer under actual deposition parameters was used for the development of a multizone heating system that provided temperature uniformity better than 3.3 °C for a 50 mm wafer at a deposition temperature of 1050 °C. Computational flow modeling was also used during design optimization. High flow and temperature uniformity provided by a new metal organic vapor-phase epitaxy rotating-disk reactor allowed us to deposit GaN films with very good surface morphology (roughness less than 100 Å) and with thickness uniformity to less than 2% across 50 mm wafers.

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