Abstract
We report on 14 nm lateral resolution in tip-enhanced Raman spectroscopy mapping of carbon nanotubes with an experimental setup that has been designed for the analysis of opaque samples in confocal side-access through a novel piezo-driven objective scanner. The objective scanner allows for fast and stable laser-to-tip alignment and for the adjustment of the focus position with sub-wavelength precision to optimize the excitation of surface plasmons. It also offers the additional benefit of imaging the near-field generated Raman scattering at the gap between tip and sample as direct control of the tip enhancement.
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