Abstract

In this study, a novel IR projector driver that can minimize nonuniformity in electric circuits, using a dual-current-programming structure, is proposed to generate high-quality infrared (IR) scenes for accurate sensor evaluation. Unlike the conventional current-mode structure, the proposed system reduces pixel-to-pixel nonuniformity by assigning two roles (data sampling and current driving) to a single transistor. A prototype of the proposed circuit was designed and fabricated using the SK-Hynix 0.18 µm CMOS process, and its performance was analyzed using post-layout simulation data. It was verified that nonuniformity, which is defined as the standard deviation divided by the mean radiance, could be reduced from 21% to less than 0.1%.

Highlights

  • An infrared scene projector (IRSP) is a widely used piece of equipment that projects infrared (IR)images to investigate the performance of IR sensors [1,2,3,4,5,6,7]

  • These projectors are composed of IR emitters and driver integrated circuits (ICs) that are called read-in integrated circuits (RIICs) and are responsible for driving current to the IR emitters

  • High-quality IR scenes are required for accurately evaluating the performance of IR sensors; the IRSPs needs to be able to correct the nonuniformity between individual pixels of an IR emitter and an RIIC

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Summary

Introduction

An infrared scene projector (IRSP) is a widely used piece of equipment that projects infrared (IR). High-quality IR scenes are required for accurately evaluating the performance of IR sensors; the IRSPs needs to be able to correct the nonuniformity between individual pixels of an IR emitter and an RIIC. The look-up table (LUT) method is used to reduce the nonuniformity at each pixel [8,9,10,11,12,13,14]; as the radiance range of the overall pixels must be standardized to alower value to achieve uniform radiation, the performance of this method is hindered for a wide radiance range of IRSPs. to obtain high-quality IR images for wide radiance ranges, a nonuniformity reduction in emitters and ICs is required in addition to external correction.

Nonuniformity
Proposed Nonuniformity-Immune
Proposed Nonuniformity-Immune RIIC
Buffer
Design
Evaluation of Nonuniformity
Figure
Target
Emitter current of of the the IR
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