Abstract
Undoped and Erbium (Er) doped zinc oxide (EZO) thin films were deposited on glass substrate by sol–gel method using spin coating technique with different doping concentration. EZO films were characterized using X-ray diffraction (XRD), Scanning Electron Microscopy (SEM), UV–VIS-NIR transmission and single beam z scan method under illumination of frequency doubled Nd:YAG laser. The deposited films were found to be well crystallized with hexagonal wurtzite structure having a preferential growth orientation along the ZnO (002) plane. A blue-shift was observed in the band gap of EZO films with increasing Er concentration. All the films exhibited a negative value of nonlinear refractive index (n2) at 532nm which is attributed to the two photon absorption and weak free carrier absorption. Third order nonlinear optical susceptibility, χ(3) values of EZO films were observed in the remarkable range of 10−6esu. EZO (0.4at.%) sample was found to be the best optical limiter with limiting threshold of 1.95KJ/cm2.
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