Abstract
We show that there exists a nondispersive (or elastic) capacitance component Cnon which is independent of frequency f, ac amplitude VOSC, and dc bias voltage Vdc, in the frequency range of 0.063 Hz–1 MHz. It can be separated from the total capacitance Ct of ferroelectric thin films by using either the C(Vdc,f)-C[Vdc,f(r)](VOSC=const) or C(f,VOSC)-C[f,VOSC(r)](Vdc=const) plot, where f(r) and VOSC(r) are the referenced frequency and ac amplitude, respectively. Our results suggest that the dispersive and nondispersive capacitance components may originate from different dielectric relaxation mechanisms. The extracted nondispersive Cnon can be a useful physical parameter in evaluating maximum dielectric tunability for the phase-shift application of ferroelectric thin films in microwave devices and characterizing phase-transition temperature in a multilayered 0.2Pb(Zn1∕3Nb2∕3)O3–0.8BaTiO3∕Pb(Mg1∕3Nb2∕3)O3 relaxor.
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