Abstract
A microwave sensor for non-destructive measurement of dielectric thickness is presented. The sensor is a quasi-static resonator and based on complementary split ring resonator (CSRR) structure. When the CSRR structure is backed by a conductive medium covered with a dielectric layer the resonance frequency of the CSRR has a strong dependence on the thickness of the dielectric layer. Effect of the size of CSRR sensor on the sensitivity is analyzed numerically. For experimental verification, a CSRR sensor that operates in the 1.6 to 2.3 GHz band is fabricated and excited by a microstrip line.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
