Abstract
AbstractThe conductivity of copper II phthalocyanine (CuPc) thin films with different crystal structures andmorphologies was evaluated by using a near-field microwave microprobe (NFMM) technique in thefrequency range of 4-4.5 GHz. CuPc thin films annealed at 200 °C and 350 °C showed the a- and yS-phasecrystal structures, respectively. Crystal phase structure and morphology of CuPc thin films werecharacterized by optical absorption spectra measurement, X-ray diffraction, and scanning electronmicroscopy methods. Conductivity measurements of CuPc thin films were done in the temperatures rangeof25-160 °C.
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