Abstract
We report non-saturating linear magnetoresistance (LMR) in silver-poor composite thin films of Ag10Ge15Te75 (AGT). The LMR increases with decreasing temperature and reaches a value of 110% at 200K under a magnetic field of 70kOe. The observed magnetoresistance is proportional to carrier mobility due to identical temperature dependencies. The microstructures of AGT films annealed at different temperature are investigated by TEM observations. The observed LMR effect is resulting from the inhomogeneous distribution of conductivity caused by highly conductive Ag2Te and GeTe4 precipitates, which generate a current distortion in the surrounding amorphous silver-poor Ag–Ge–Te matrix.
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