Abstract
Temperature dependent in-plane polarized Cu K-edge extended x-ray absorption fine structure (EXAFS) study has been carried out on a high quality single crystal of oxygen doped La 2 CuO 4.1 (LCO) system to investigate the local structure around Cu. The EXAFS data recorded with high degree of plane polarization and up to high momentum transfer (Q=40 A -1 = 2k) allowed the quantitative detennination of the distorted and undistorted Cu planes. The determination of the Cu-O(planar) distances shows presence of minority Cu sites characterized by two the coexistence of localized and a tilting of 15° with the average crystallographic structure at T < T s - 150 K. The data show the coexistence of localized and itinerant charges trapped into stripes of distorted and undistorted domains within the CuO 2 plane.
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