Non-destructive one-shot device test under step-stress experiment with lognormal lifetime distribution

Abstract

Dealing with censored data is an important concern in reliability and survival analysis. Non-destructive one-shot devices are an extreme case of interval censoring, wherein we only know if a device has failed or not before an inspection time. Besides, non-destructive one-shot devices are frequently highly reliable with large lifetimes, and then long experimentation times would be needed for inference under normal operating conditions. Alternatively, accelerated life tests (ALTs) shorten the lifetime of the devices by increasing one or more stress factors causing failure. Then, after suitable inference, results can be extrapolated to normal conditions. In particular, step-stress ALT designs increase the stress level at which devices are tested throughout the experiment at some fixed times. Under the non-destructive one-shot device set-up, the number of failures is recorded at some inspection times, including the times of stress change, then resulting in censored data. Among the most popular lifetime distributions used to analyze survival data, the lognormal distribution has hazard function with an increasing–decreasing behavior, which is encountered often in practice as units usually experience early failure and then stabilize over time in terms of performance. However, the classical maximum likelihood estimator (MLE) of parameters of the lognormal lifetime distribution may get highly influenced by data contamination. In this paper we propose a family of divergence-based robust estimators for non-destructive one-shot device step-stress experiments under the lognormal lifetime distribution. Further, from the robust estimators, a generalization of the popular Wald-type test statistic based on the MLE for testing composite null hypothesis is defined, resulting in a robust divergence-based family of test statistics.