Abstract
The growth of thermally grown oxide (TGO) layers in thermal barrier coatings (TBCs) due to the oxidation of the bondcoat alloy is a critical factor affecting the durability of TBCs. In the present study, diverse TBC specimens were subjected to long-term oxidation at various temperatures. The TGO growth mechanism was investigated according to cross-sectional images of the oxidized specimens. Impedance spectroscopy (IS) was performed to measure the electrical properties of the integrated TBCs non-destructively. Considering the influence of the TGO composition, the derived TGO electrical capacitance was found to have a good correspondence to the observed TGO thickness over a wide range 0–18.3 μm, regardless of the diverse specimens and oxidation conditions. The error was less than ±2.0 μm. With a certain design of the electrode size, IS is generalized and is recommended as an accurate and practical non-destructive evaluation method for the determination of TGO thickness within a very wide range in TBC systems under real operating conditions.
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