Abstract
With silicon solar cells as the research object, this paper takes their nondestructive character and analyzes their quality with noise-based technology. Through the stress aging of samples and the testing of various types of noise, including 1/f noise, microplasma noise, and G-R noise, in the cells in the laboratory, the noise characteristics are analyzed. The research results show that noise is correlated with defects in silicon solar cells. The different types of noise can be used to characterize different parts and types of defects in the cells according to the mechanism of generation of noise and the failure physics of photovoltaic devices, and thereby, the evaluation of the quality and analysis of the reliability of solar cells can be achieved.
Highlights
In recent years, photovoltaic power generation technology has been developing rapidly, and certain deep-seated issues restricting development in the photovoltaic industry have stood out
There are some deficiencies in the traditional quality test technology and reliability analysis for solar cells
According to the mechanism of the generation of the different types of noise, combined with the physics of failure of solar cells, noise can be connected with different defects at different positions of cells
Summary
Photovoltaic power generation technology has been developing rapidly, and certain deep-seated issues restricting development in the photovoltaic industry have stood out. All the abovementioned issues require a proposal of quality tests and reliability analyses applicable to photovoltaic products. There are some deficiencies in the traditional quality test technology and reliability analysis for solar cells. Acoustic detection can be carried out by selecting interface regions at different depths within the cell sheet or panel to reflect the conditions of stratification of adhesive and poor contact between the air hole and metal board but is not sufficiently sensitive to the defects inside a single material. With the electric parameter detection method most commonly adopted in national or industrial standards, the parameters are easy to obtain; the sensitivity of the characterization is not high, and no direct relations with defects are available. A more rapid, sensitive, nondestructive technology directly related to defects is needed to test and characterize the quality of photovoltaic products.
Sign-in/Register to view highlights & summary Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
