Abstract
Noise measurements were performed on several commercially available phototransistor optical isolators in order to examine the signal detection limits of typical devices. It was found that, in general, phototransistor optical isolators are very noisy devices exhibiting all of the common types of noise usually found in bipolar junction transistors. A large number of devices exhibited burst noise which dominated their low-frequency noise performance. The noise performance of devices without burst noise was dominated by 1 f noise or flicker noise at low frequencies and by shot noise at high frequencies. Experimental data indicates that in most cases the electrical noise contribution of the LED is negligible and that the dominant source of noise is the phototransistor.
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