Abstract
The noise characteristics of a cooled CCD device induced by neutron and gamma ray irradiation have been investigated. In the cooled CCD images, characteristic white spot noises (CCD noise) frequently appeared, which have a shape like a pixel in most cases and their brightness is extremely high compared with that of the image pattern. They could be divided into the two groups, fixed pattern noise (FPN) and random noise. The former always appeared in the same position in the image and the latter appeared at any position. In the background image, nearly all of the CCD noises were found to be the FPN, while many of them were the random noise during the irradiation. The random CCD noises increased with irradiation and decreased soon after the irradiation. In the case of large irradiation, a part of the CCD noise remained as the FPN. These facts suggest that the CCD noise is a phenomenon strongly relating to radiation damage of the CCD device.
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