Abstract
The room temperature nitriding of titanium is accomplished by utilizing nitrogen ion beams delivered by a 2.3 kJ plasma focus discharge. Titanium samples are exposed to ions at different axial positions (3, 5, 7 and 9 cm from the focus) in order to correlate their surface properties with ion beam parameters such as energy, number density, current density and energy flux (energy deliverance per unit time per unit volume). A BPX65 photodiode detector is employed to measure the ion beam parameters by using the time of flight technique. X-ray diffraction analysis as well as field emission scanning electron microscopy along with the energy dispersive x-ray spectroscopy is carried out to explore the structural, morphological and compositional profiles of the treated samples. The results demonstrate the formation of nanocrystalline TiN thin film with surface features strongly dependent on ion beam energy flux. A Vickers microindentation measurement reveals that the surface hardness is improved 4–5 times for typical nitrided samples.
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