Abstract
Abstract GaN epitaxial layers and nitride-based light-emitting diodes (LEDs) structures with a conventional single low-temperature (LT) GaN buffer layer and multiple Mg x N y /GaN buffer layers were prepared by metalorganic chemical vapor deposition. It was found that crystal quality of the GaN epilayer prepared on multiple Mg x N y /GaN buffer layers was significantly better than that prepared with conventional low-temperature GaN nucleation layer. With the multiple Mg x N y /GaN buffer layers, it was also found that 20 mA LED output power can be enhanced by 12%, as compared to the conventional LED. Such an enhancement in output power could be attributed to the reduction of threading dislocation induced nonradiative recombination centers using 12-pairs Mg x N y /GaN buffer layers.
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