Abstract
Periodic V-grooves channels, upright, and inverted pyramids structures were texturized on monocrystalline silicon (c-Si) substrates using ammonium hydroxide (NH <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> OH) solution. This cheap and CMOS compatible etching solution aims at the integration of circuits with photovoltaic (PV) cells for monolithic purposes. To obtain these structures, lithographed silicon dioxide (SiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> ) patterns were used to delimit the c-Si surface regions to be etched by the NH <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> OH solution. After the SiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> removal, a scanning electron microscopy images of the surface of the samples showed that the NH <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">4</sub> OH etch exposed the <;111> facets, outlined by the SiO <sub xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">2</sub> patterns, creating periodic V-groove channels, inverted, and upright pyramids structures with depths of 5.9 ± 0.1, 5.7 ± 0.4, and height of 6.9 ± 0.1 μm, respectively. These ordered structures reduced a polished c-Si control sample reflectance by 57.6 ± 0.1%, 53.3 ± 0.1%, and 51.6 ± 0.1%, measured by a spectrophotometer with integrating sphere and having reflectance values of 16.5%, 18.2%, and 18.9%, respectively. These results indicate that the etched periodic structures using a cheap and CMOS compatible NH4OH solution, increases the c-Si light trapping, by reducing its reflectance for values lower than 20%, which could be used to increase the light absorption on PV cells.
Published Version
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