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https://doi.org/10.1108/eb044150
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Cite Journal: Microelectronics International |  Publication Date: Jan 1, 1984 |
 Citations: 1 |
Spring Test Probe for Microcircuit Testing Coda Systems have announced the availability of a new range of spring test probes originating from their principal, Ostby and Barton, which have been specifically designed for the testing of thick and thin film microcircuits.
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