Abstract
A new powder diffractometer for the Photon Factory was designed and constructed in 1986. Its performance has been confirmed as follows: (1) it is capable of determining the wavelength of the Cu K edge as 1.380619±0.000012 A using NBS standard Si powder 640b, while the reported one is 1.38059 A; (2) the accuracy of monitoring the incident beam intensity was ±0.2%, which was estimated by the normalized integrated intensity; (3) the angle resolution of diffraction lines was comparable with that of SSRL; and (4) the sum of three Gaussians was the best profile function fitted for lines from NBS standard Si powder 640b.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
