Abstract
The ability to verify the geometrical quality of a machined workpiece on the machine tool itself can be a crucial advantage in ultra-precision diamond turning. This paper presents a new positioning procedure for optical one-dimensional (1D) probes integrated on diamond turning machines with two horizontal linear axes and one rotational axis. A tilted flat, mounted onto the spindle, is used to determine the offsets between the probe and the spindle axis in order to minimize measurement deviations referred to probe alignment errors. An estimation of the positioning uncertainty, which can be specified to be less than 0.3 µm, is given.
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