New measurements of Mαβ, Mγ and total M-shell X-ray production cross sections induced by carbon ions on Bi and Pt targets

Abstract

In this work X-ray and elastic backscattered spectra from Pt and Bi thin targets were simultaneously measured using C4,3+ ions in the energy range 2.5 MeV to 5 MeV. Mαβ, Mγ and total M-shell X-ray production cross sections were extracted from collected X-ray and backscattered particle spectra using calibrated SDD X-ray and silicon solid state particle detectors. The obtained cross section values are compared to theoretical values employing commonly used datasets for fluorescence yields, emission rates, Coster-Kronig transitions and M-shell ionization cross sections based on the Semi-classical Approximation (United Atom and Separated Atom limits), PWBA (Plane Wave Born approximation), and ECPSSR models. The ISICS code was used for PWBA and ECPSSR calculations.