Abstract
A new experimental methodology is proposed which uses the electrostatic influence method (EIM) in scanning electron microscope (SEM) in order to estimate the second crossover energy EC2 for uncharged insulators. This experimental methodology based on simultaneous time measurement of the displacement and leakage currents, is approached to the short pulse irradiation technique but under stationary e-irradiation and allows determining the intrinsic secondary electron emission yield, σ0 (σ0 is the value of the total secondary electron yield just at the beginning of the irradiation before significant charge accumulation or before the formation of a surface potential). The obtained value of EC2 for soda-lime glass is confirmed by two additional experiments based on secondary electron imaging. This value is in good agreement with those previously obtained by other studies based on the surface potential measurement or the pulsed irradiation technique.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
