Abstract
Time-of-flight secondary ion mass spectrometry (TOF-SIMS) analyzes chemical information by measuring ions generated via bombardment of an energetic ion beam on the surface of a specimen. Negative hydrocarbon ion species of C2nH− are ubiquitous in TOF-SIMS for any hydrocarbon-containing materials, but their utilities are perhaps not fully explored. Using polyethylene, polypropylene, polyisoprene, and polystyrene, the author demonstrates that C2nH− species possess intrinsic relationships, which offers unique TOF-SIMS ability for quantitatively differentiating the chemical structures of the four polymers.
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More From: Journal of Vacuum Science & Technology B, Nanotechnology and Microelectronics: Materials, Processing, Measurement, and Phenomena
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