Abstract
We report a nondestructive testing system based on near-field scanning microwave microscopy. The instrumentation is built up with a vector network analyzer, a fully automated tuning matching network and an evanescent microwave probe. The system can perform microwave images in the frequency band 0.1–20 GHz on scanning ranges of 25×25 cm2. The spatial resolution is experimentally verified by investigating imaging of metal slots. A lumped element model is built to describe the probe-sample interaction.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
