Abstract
Low-frequency (below 100 kHz, even down to several kHz) near-field acoustic probe microscopy for imaging ferroelectric microstructure was successfully developed based on the commercial atomic force microscope, which provides a subsurface depth profile information and as well as nanoscale spatial resolution up to 10 nm. The domain configurations of ferroelectric material were clearly visualized by this newly, non-destructive, low-frequency acoustic mode scanning probe microscopy technique with high resolution. The acoustic imaging origin is discussed in terms of interaction between the excited acoustic wave and ferroelectric domains. It is expected that the combination of the acoustic and piezoresponse mode probe microscopy in application to imaging domain structures undoubtedly enrich our understanding the nature of elasticity, piezoelectricity and ferroelectricity at submicro-, even nano-meter scale.
Published Version
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