Abstract
The near tip stress intensity factor K I tip for an edge-crack in a Pb(Zr x Ti 1− x )O 3 thin film was investigated by superposition of the applied stress intensity factor K I app under a continuous laser irradiation and the shielding stress intensity factor Δ K I for 90° domain switching. Both K I app and Δ K I were solved by the weight function method, and switching toughening was analyzed based on the small scale domain switching theory. Results show that K I tip of the edge-crack in the thin film is significantly affected by the initial poling angle, and the edge-crack tip is toughened by the domain switching area with the increase of the initial poling angle. The methodology can predict the fracture toughening of Pb(Zr x Ti 1− x )O 3 thin films quantitatively.
Published Version
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