Abstract
Monolayer triangular WS2 and MoS2 islands grown by chemical vapor deposition was investigated by near-field photoluminescence (nano-PL) enhanced by the metallized atomic force microscope (AFM) tip. To achieve maximum near-field response from WS2 and MoS2 materials fabricated Au and Ag metallized AFM tips were used. Maximum nano-PL responds from the islands is observed under the resonant conditions when the energy of the localized surface plasmon of the metallized probe coincides with the energy of the exciton luminescence of the WS2 and MoS2 materials. Nano-PL mapping of the exciton response allows visualizing structural defects and determine the local thickness changes of monolayer islands with nanometer spatial resolution.
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