Abstract
We propose an experimental method of near field optical imaging by scanning probe microscopy in which the probe itself serves as an infrared photodetector. The method providing a submicron spatial resolution is based on detection of a shift of the probe resonance related to its heating by absorbed IR radiation. The method does not require an apertured probe and can be realized with a conventional silicon probe used in atomic force microscopy. The method has been employed for visualization of infrared emission from a half-disk semiconductor whispering gallery mode laser.
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