Near-Bandgap Photoluminescence Decay Time in GaN Epitaxial Layers Grown on Sapphire

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ABSTRACTUsing picosecond time-resolved photoluminescence we have studied the decay time of excess carriers in GaN epitaxial layers over a wide range of temperatures from 4 K up to 400 K. At low temperature, a thermal dissociation of donor-bound excitons is observed. At higher temperatures up to room temperature, the luminescence decay at moderate excitation is governed by trapping of photogenerated electrons in ionized shallow donor levels. Using measured luminescence intensities to determine the quantum efficiency, we obtain the radiative lifetime of free excitons from low temperature up to room temperature. We use these data to determine the radiative recombination coefficient and the interband momentum matrix element.