Abstract
We performed scanning force microscopy (SFM) in ultrahigh vacuum (UHV) on C 60 and AgBr thin films deposited on NaCl(001) substrates. The morphology of the initial growth stage and the nanotribological properties of these thin films are characterized and discussed. A novel experimental approach is presented where local friction coefficients are determined: the lateral (frictional) forces are measured as a function of normal load, controlled by an external ramp generator. The local friction coefficient can be extracted by means of the two-dimensional histogram technique. In the low load regime, friction coefficients of 0.15 ± 0.02, 0.33 ± 0.07 and < 0.03 were found between probing SiO x tip and C 60, AgBr and NaCl, respectively. The two-dimensional histogram reveals significant details about the force regime of wear-less friction and the initial stage of wear on these thin films.
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