Abstract
The characteristics of e-beams held emitted from nanotips, which are atom-sources of electrons, were analysed experimentally for non-magnetic and ferromagnetic nanotips. Their specific characteristics are fully exploited in a versatile low-energy electron projection microscope: the Fresnel projection microscope. Observations of nanometric fibres of carbon and of organic materials were performed with working voltages around 200 V. The images show, in the direct space, details of the objects of less than 1 nm without any magnetic shielding.
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Schedule a callMore From: Philosophical Transactions of the Royal Society of London. Series A: Physical and Engineering Sciences
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