Abstract

Highly transparent Zinc Oxide (ZnO) thin films were prepared by reactive DC magnetron sputtering onto thoroughly cleaned stainless steel and glass substrates. X-ray diffraction (XRD) pattern revealed that the sputtered films were crystalline in nature with preferred (002) orientation. The crystallite size was increased from 22 to 27 nm as the bias increases. The prepared ZnO films exhibited better anti adhesion activity against S.aureus.

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